FRANÇAIS
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Space Environment
SEE
Single Event Effects Simulation Facilities for Studies
Objectives
- Studies of Single Events Effects (SEE) induced by high energy cosmic radiations and trapped protons in electronic devices
Simulation Facilities
- CIRIL irradiator fitted with Cf252 and Am241 sources
- Preferable access to the 14MV Tandem accelerator of the IPN in Orsay (France)
- Access to additional facilities: UCL (Belgium), PSI (Switzerland), JYFL (Finland), BNL (USA), high-energy facilities GATCHINA& DUBNA (Russia)
Characterization Facilities
- SEETEST system: SEE characterisation of memories (SRAM, DRAM...) and LSI devices (including a Latch-up test module)
- MTRSEL system: SEL characterisation for all kind of devices (8 channels)
- µSET: portable test bench for the SEE testing of complex digital devices (FPGA-based)
- MEMTOR: advanced test system for mixed and logic devices
On-Board Experiments
- "Component" boards allowing in-situ SEE/TID testing in several missions (MIR, ISS, SAC-C, MPTB)
- Currently, SEE and Total Dose test boards on ISS (SPICA), SAC-C (ICARE)
Funding
- Centre National d’Etudes Spatiales (CNES)
- Centre National d'Etudes et de Recherches Aérospatiales (ONERA)
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