Space Environment

TEST
Electronic Devices Characterization Facilities

Objectives

• Electronic components characterization during application of the space radiations constraints
• Study of the degradation mechanisms due to irradiation and evaluation methods analysis

Facilities

• ITS 9000 MX mixed tester for VLSIs
• LTS2020 Analog Devices test bench for linear devices
• Distest test bench for discrete and mixed devices
• Optical conditionning bench for optical integrated sensors (CCD, APS)
• Measurements performed according to main standards (MIL STD 883, SCC ESA…)

Funding

• Centre National d’Etudes Spatiales (CNES)
• Conseil Régional Midi-Pyrénées
• Centre National d'Etudes et de Recherches Aérospatiales (ONERA)

Last Update:April 25, 2003 - © ONERA 2009 - Terms of use