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DESP - Environnement spatial

Publications

2014

 

2013

 

2012

[1] M. Belhaj, T. Tondu, V. Inguimbert, B. Elsafi (LaMaCop), S. Fakhfakh (LaMaCop). Electron emission yield and charging process of alkali-silicate glass submitted to an electron beam under the varying temperature conditionNuclear Instruments and Methods in Physics Research B Vol. B-270, pp. 120-127 

[2] J.R. Sanmartin (UPM), M. Charro (UPM), X. Chen (UPM), E.C. Lorenzini (Univ. Padova), G. Colombatti (Univ. Padova), D. Zanutto (Univ. Padova), J.-F. Roussel, P. Sarrailh, J.D. Williams (Colorado S. Univ.), K. Xie (Colorado S. Univ.), G.E. Metz (Colorado S. Univ.), J.A. Carrasco (EIS S.L.), F. Garcia De Quiros (EIS S.L.), O. Kroemer (DLR), R. Rosta (DLR), T. Van Zoest (DLR), J. Lasa (Fund. Tecnalia), J. Marcos (Fund. Tecnalia). A universal system to de-orbit satellites at end of life. Journal of Space Technology and Science Vol. 26 n° 1 

[3] A. Cheminet, V. Lacoste (IRSN), V. Gressier (IRSN), G. Hubert, A. Martin (IRSN), M. Pépino (IRSN). Characterization of the IRSN neutron multisphere spectrometer (HERMEIS) at European standard calibration fieldsJournal of Instrumentation Vol. 7 - Avril 2012 

[4] S. Lejosne, D. Boscher, V. Maget, G. Rolland (CNES). Bounce-averaged approach to radial diffusion modeling: From a new derivation of the instantaneous rate of change of the third adiabatic invariant to the characterization of the radial diffusion process. Journal of Geophysical Research Vol. 117, A08231, doi:10.1029/2012JA018011 

[5] L. Lorenzato, A. Sicard Piet, S. Bourdarie. A physical model for electron radiation belts of SaturnJournal of Geophysical Research VOL. 117, A08214  

[6] N.P. Meredith (BAS), R.B. Horne (BAS), A. Sicard Piet, D. Boscher, K.H. Yearby (Univ. Sheffield), W. Li (UCLA), R.M. Thorne (UCLA). Global model of lower band and upper band chorus from multiple satellite observationsJournal of Geophysical Research VOL. 117, A10225, doi:10.1029/2012JA017978 

[7] J.-C Matéo Vélez, V. Inguimbert, K. Toyoda (KIT), D. Payan (CNES), N. Balcon (CNES). Time-resolved spectroscopy of electrostatic discharge and secondary arc plasma on spacecraft solar array. IEEE Transactions on Plasma Science Vol. 40, n° 2, pp.359-367 

[8] J.-M. Siguier, V. Inguimbert, P. Sarrailh, D. Sarrail, G. Murat, J.-C Matéo Vélez, D. Payan (CNES), N. Balcon (CNES). Parametric study of a physical flashover simulator. IEEE Transactions on Plasma Science Vol. 40, n° 2, pp. 311-320 

[9] J.-C Matéo Vélez, J.-F. Roussel, D. Rodgers (ESA), A. Hilgers (ESA), M. Sevoz (ASTRIUM), P. Pélissou (ASTRIUM). Conceptual design and assessment of an electrostatic discharge and flashover detector on spacecraft solar panels. IEEE Transactions on Plasma Science Vol. 40, n° 2, pp. 246-253 

[10] J.-F. Roussel, G. Dufour, J.-C Matéo Vélez, B. Thiébault (Artenum), B. Andersson (SSC), D. Rodgers (ESA), A. Hilgers (ESA) , D. Payan (CNES). SPIS multi-timescale and multi-physics capabilities: development and application to GEO charging and flashover modelling. IEEE Transactions on Plasma Science Vol. 40, n° 2 

11. J.-C Matéo Vélez, J.-F. Roussel, V. Inguimbert, M. Cho (KIT), K. Saito (KIT), D. Payan (CNES). SPIS and MUSCAT software comparison on LEO-like environment. IEEE Transactions on Plasma Science Vol. 40, n° 2, pp. 177-182 

[12] N. Balcon (CNES), D. Payan (CNES), M Belhaj, T. Tondu, V. Inguimbert. Secondary electron emission on space materials: evaluation of the total secondary electron yield from surface potential measurements. IEEE Transactions on Plasma Science Vol. 4, n° 2 part 1, pp. 282-290 

[13] P. Sarrailh, J.-C Matéo Vélez, J.-F. Roussel, B. Dirassen, J. Forest (Artenum), B. Thiébault (Artenum), D. Rodgers (ESA), A. Hilgers (ESA). Comparison of numerical and experimental investigations on the ESD onset in the inverted potential gradient situation in GEO. IEEE Transactions on Plasma Science Vol. 40, n° 2, pp. 368-379 

14] J. Wang (USCLA), P. Wang (VPI), M. Belhaj, J.-C Matéo Vélez. Modeling Facility Effects on Secondary Electron Emission Experiment. IEEE Transactions on Plasma Science Vol. 40, N°10, pp. 2773-2780 

[15] M. Raine (CEA-DAM), G. Hubert, P. Paillet (CEA-DAM), M. Gaillardin (CEA-DAM), A. Bournel (IEF-CNRS). Implementing realistic heavy ion tracks in a SEE prediction tool: comparison between different approaches. IEEE Transactions on Nuclear Science Vol. 59, n° 4, pp. 950-957

[16] C. Inguimbert, S. Messenger (US-NRL) . Equivalent Displacement Damage Dose for On-Orbit Space Applications. IEEE Transactions on Nuclear Science Vol. 59, n° 6, pp.3117-3125  

17] A. Cheminet, V. Lacoste (IRSN), G. Hubert, D. Boscher, D. Boyer (LSBB), J. Poupeney (LSBB). Experimental measurements of the cosmic-ray induced neutron spectra at various mountain altitudes with HERMEIS. IEEE Transactions on Nuclear Science Vol. 59, n° 4, pp. 1722-1730 

[18] P. Molinié (Supélec), P. Dessante (Supélec), R. Hanna, T. Paulmier , B. Dirassen, M. Belhaj, D. Payan (CNES), N. Balcon (CNES). Polyimide and FEP charging behavior under multi-energetic electron-beam irradiation. IEEE Trans. on Dielectrics and Electrical Insulation Vol. 19 n° 4 - Août 2012 

[19] S. Guillemant, V. Génot (IRAP), J.-C Matéo Vélez, R. Ergun (LASP), P. Louarn (IRAP). Solar wind plasma interaction with solar probe plus spacecraft. Annales Geophysicae vol 30, pp. 1075–1092 

[20] S. Bourdarie, V. Maget. Electron radiation belt data assimilation with an ensemble Kalman filter relying on the Salammbo code. Annales Geophysicae Vol. 30, pp. 929-943

[21] T. Paulmier, B. Dirassen, D. Payan (CNES). Charging behavior of space-used adhesives at low temperature in geostationary orbit. J. of Spacecraft and Rockets Vol. 49 n° 1

 

Chapitres d’ouvrages scientifiques

T. Tondu, M. Belhaj, J. Roupie. Emission électronique sous impact d'électrons de basse énergie. Meudon : Mission Ressources et Compétences Technologiques (MRCT) - Plasma et son environnement - Plasmas froids en France et au Québec - ISBN : 978-2-918701-09-5

 

2011

[1] V. Rejsek-Riba, V. Inguimbert, S. Duzellier, C. Pons, M. Crepel, and A. P. Tighe. Spectrometers results of material exposure and degradation experiment onboard international space station. J. of Spacecraft and Rockets, 48(1):38–44, January-February 2011.

[2] A. Woelfflé, D. Boscher, and I. Dandouras. Plasma transport modelling in the inner magnetosphere: effects of magnetic field, electric field and exospheric models. Annales Geophysicae, 29:427–442, February 2011.

[3] T. Paulmier, B. Dirassen, and D. Payan. Charging behavior of polyimide/adhesive components during eclipse events in geostationary environment. J. of Spacecraft and Rockets, 48(2):226–234, March-April 2011.

[4] J.-F. Roussel, T. Tondu, T. Paulmier, D. Faye, M. van Eesbeek, and R. Rampini. Progress on the physical approach to molecular contamination modeling. J. of Spacecraft and Rockets, 48(2):246–255, March-April 2011.

[5] M. Belhaj, T. Tondu, and V. Inguimbert. Effect of the incident electron fluence on the electron emission yield of polycrystalline Al2O3. Applied Surface Science, 257(10):4593–4596, March 2011.

[6] T. Tondu, J.-Ch. Matéo-Vélez, J.-F. Roussel, and E. Chesta. Cesium droplet evaporation as contamination route by cesium field effect electric propulsion. J. of Spacecraft and Rockets, 48(3):513–519, May-June 2011.

[7] G. Hubert, S. Bourdarie, L. Artola, S. Duzellier, and J.-F. Roussel. Multi-scale modeling to investigate the single event effects for space missions. Acta Astronautica, 69:526–536, June 2011.

[8] G. Touré, G. Hubert, K. Castellani-Coulié, S. Duzellier, and J. M. Portal. Simulation of single and multi-node collection: impact on SEU occurrence in nanometric SRAM cells. IEEE Transactions on Nuclear Science, 58(3):862–869, June 2011.

[9] L. Artola, G. Hubert, K. W. Warren, M. Gaillardin, R. D. Schrimpf, R. A. Reed, R. A. Weller, J. R. Ahlbin, P. Paillet, M. Raine, S. Girard, S. Duzellier, L. W. Massengill, and F. Bezerra. SEU predictoin from SET modeling using multi-node collection in bulk transistors and SRAMs down to the 65 nm technology node. IEEE Transactions on Nuclear Science, 58(3):1338–1346, June 2011.

[10] P. Arnolda, Ch. Inguimbert, T. Nuns, and C. Boatella Polo. NIEL scaling: comparison with measured defect introduction rate in silicon. IEEE Transactions on Nuclear Science, 58(3), June 2011.

[11] A. Sicard-Piet, S. Bourdarie, and N. Krupp. JOSE: a new jovian specification environment model. IEEE Transactions on Nuclear Science, 58(3):923–931, June 2011.

[12] E. Martin, T. Nuns, J.-P. David, O. Gilard, M. Boutillier, and A. Penquer. Dose rate and static/dynamic bias effects on CCDs degradation. IEEE Transactions on Nuclear Science, 58(3):891–898, June 2011.

[13] D. Boscher, S. Bourdarie, D. Falguere, D. Lazaro, P. Bourdoux, T. Baldran, G. Rolland, E. Lorfèvre, and R. Ecoffet. In-flight measurements of radiation environment on board the french satellite JASON 2. IEEE Transactions on Nuclear Science, 58(3):916–922, June 2011.

[14] K. Castellani-Coulié, G. Touré, J. M. Portal, O. Ginez, H. Aziza, and A. Lesea. Circuit effect on collection mechanisms involved in single event phenomena: application to the response of a NMOS transistor in a 90 nm SRAM cell. IEEE Transactions on Nuclear Science, 58(3), June 2011.

[15] M. Raine, G. Hubert, M. Gaillardin, L. ARTOLA, P. Paillet, S. Girard, J. E. Sauvestre, and A. Bournel. Impact of the radial ionization profile on SEE prediction for SOI transistors and SRAMs beyond the 32-nm technological node. IEEE Transactions on Nuclear Science, 58(3):840–847, June 2011.

[16] A. Trigano, G. Hubert, J. Marfaing, and K. Castellani-Coulié. Experimental study of neutron-induced soft errors in modern cardiac pacemakers. J. of Interventional Cardiac Electrophysiology, August 2011.

[17] M. Belhaj, T. Tondu, V. Inguimbert, B. Elsafi, S. Fakhfakh, and O. Jbara. Electron emission yield and charging process of alkali-silicate glass submitted to an electron beam under the varying temperature condition. Nuclear Instruments and Methods in Physics Research B., 270:120–127, September 2011.

[18] R. Hanna, T. Paulmier, M. Belhaj, P. Molinié, B. Dirassen, D. Payan, and N. Balcon. Characterization of charge carrier lateral conduction in irradiated dielectric materials. J. of Physics D: Applied Physics, 44, October 2011.

[19] N. Balcon, D. Payan, M. Belhaj, T. Tondu, and V. Inguimbert. Secondary electron emission on space materials: Evaluation of the total secondary electron yield from surface potential measurements. IEEE Transactions on PlasmaScience, 99, October 2011.

[20] T. Tondu, M. Belhaj, and V. Inguimbert. Electron-emission yield under electron impact of ceramics used as channel materials in hall-effect thrusters. J. of Applied Physics, 110, November 2011.

[21] P. Truscott, D. Heynderickx, A. Sicard-Piet, and S. Bourdarie. Simulation of the radiation environment near europa using the geant4-based PLANETOCOSMICS-J model. IEEE Transactions on Nuclear Science, 58(6):2776–2784, December 2011.

[22] M. Raine, G. Hubert, M. Gaillardin, P. Paillet, and A. Bournel. Monte carlo prediction of heavy ion induced MBU sensitivity for SOI SRAMs using radial ionization profile. IEEE Transactions on Nuclear Science, 58(6):2607–2613, December 2011.

[23] L. Artola, R. Velazco, G. Hubert, S. Duzellier, T. Nuns, B. Guérard, P. Peronard, . Mansour, F. Pancher, and F. Bezerra. In flight SEU/MCU sensitivity of commercial nanometric SRAMs: Operational estimations. IEEE Transactions on Nuclear Science, 58(6):2644–2651, December 2011.

Autres Revues

[24] M. Raine, P. Paillet, M. Gaillardin, J. E. Sauvestre, G. Hubert, and A. Bournel. Sensibilité aux radiations des composants électroniques avancés : effet de l’énergie des ions lourds. CHOCS-CEA/DAM, pages 36–37, 2011.

Chapitres d’ouvrages scientifiques

[25] E. Sicard, O. Maurice, A. Reineix, and G. Hubert. Compatibilité électromagnétique - notions fondamentales. Techniques de l’Ingénieur, E1302, mai 2011.

[26] O. Maurice, G. Hubert, E. Yalcin, and F. Lafon. Notions de CEM des systèmes. Techniques de l’Ingénieur, E1305, novembre 2011.

2010

[1] M. P. Nghiem, T. Tondu, J.-F. Roussel and D. Faye, Molecular thin film chemical modifications under vacuum ultraviolet irradiation, J. of Vacuum Science and Technology A, 28 (1), pp. 119–126 (January 2010).

[2] M. Caillon-Caravanier, J. Jones, M. Anouti, F. Montigny, P. Willmann, J.P. David, S. Soonckindt and D. Lemordant, Gamma ray degradation of electrolytes containing alkylcarbonate solvents and a lithium salt, J. of Power Sources, 195 (2), pp. 614–620 (January 2010).

[3] M. Belhaj, T. Tondu, V. Inguimbert, P. Barroy, F. Silva and A. Gicquel, The effects of incident electron current density and temperature on the total electron emission yield of polycrystalline CVD diamond, J. of Physics D : Applied Physics, 43 (March 2010).

[4] T. Okumura, M. Cho, V. Inguimbert, D. Payan, B. Vayner and D.C. Ferguson, International round-robin tests on solar cell degradation due to electrostatic discharge, J. of Spacecraft and Rockets, 47 (3), pp. 533–541 (May-June 2010).

[5] L. Artola, G. Hubert, S. Duzellier and F. Bezerra, Collected charge analysis for a new transient model by TCAD simulation in 90nm technology, IEEE Transactions on Nuclear Science, 57 (4), pp. 1869–1875 (August 2010).

[6] C. Inguimbert, P. Arnolda, T. Nuns and G. Rolland, Effective NIEL in silicon: calculation using molecular dynamics simulation results, IEEE Transactions on Nuclear Science, 57 (4), pp. 1915–1923 (August 2010).

[7] C. Boatella-Polo, G. Hubert, R. Ecoffet and S. Duzellier, ICARE on-board SAC-C : more than 8 years of SEU and MCU, analysis and prediction, IEEE Transactions on Nuclear Science, 57 (4), pp. 2000–2009 (August 2010).

[8] T. Tondu, M. Belhaj and V. Inguimbert, Methods for measurement of electron emission yield under low energy electron-irradiation by collector method and Kelvin probe method, J. of Vacuum Science and Technology A, 28 (5), pp. 1122–1125 (September-October 2010).

[9] G. Hubert, S. Bourdarie, L. Artola, S. Duzellier, C. Boattela-Polo, F. Bezerra and R. Ecoffet, Impact of the solar flares on the SER dynamics on micro and nanometric technologies, IEEE Transactions on Nuclear Science, 57 (6 Part 1), pp. 3127–3134 (December 2010).

[10] C. Virmontois, V. Goiffon, P. Magnan, S. Girard, C. Inguimbert, S. Petit, G. Rolland and O. Saint-Pé, Displacement damage effects due to neutron and proton irradiations on CMOS image sensors manufactured in deep submicron technology, IEEE Transactions on Nuclear Science, 57 (6), pp. 3101–3108 (December 2010).

 

Autres Départements Scientifiques