DAAA - Aerodynamics Aeroelasticity Acoustics
- ONERA
- Scientific Departments
- DAAA - Aerodynamics Aeroelasticity Acoustics
- Technical resources
DAAA - Technical resources
Major research installations
| Technical facility | Center | Unit |
| S3Ch wind tunnel | Meudon | AMES |
| Blowdown wind tunnels | Meudon | AMES |
| L1 wind tunnel | Lille | ELV |
| L2 wind tunnel | Lille | ELV |
| SV4 wind tunnel | Lille | ELV |
| GVT - Ground Vibration Testing : Capabilities - Methods | Châtillon | ADSE |
| B20 laboratory | Lille | ELV |
Laboratory research installations
| S2l wind tunnel | Meudon | AMES |
| S8 wind tunnel | Meudon | AMES |
| S19 wind tunnel | Meudon | AMES |
| R4 wind tunnel | Meudon | AMES |
| Rotary modes simulator test bench | Châtillon | AKOU |
| BRAVoS – Rotor bench adapted to stationary flight | Châtillon | ADSE |
| LABEX – 20 kN vibration table | Châtillon | ADSE |
| Boundary layer wind tunnel – PIV | Lille | ELV |
| Hydrodynamic channel | Lille | ELV |
| Compressible subsonic installation wind tunnel | Lille | ELV |
| Sonic wind tunnel | Lille | ELV |
| Low-speed hydrodynamic tunnel | Lille | ELV |
| Boundary layer wind tunnel – "hot wires" | Lille | ELV |
| ROTOR bench | Lille | ELV |
Metrological facilities
| LDV (Laser Doppler Velocimetry) | Meudon, Lille | MAPE, ELV |
| PIV (Particle Image Velocimetry) | Meudon, Lille | MAPE, ELV |
| PSP (Pressure Sensitive Paint) | Meudon | MAPE |
| Non-specific optical resources and optical metrology environment | Meudon, Lille | MAPE, ELV |
| Acoustic acquisition systems | Châtillon | AKOU |
| Electrostatic grid calibration bench | Châtillon | AKOU |
| Kundt tube | Châtillon | AKOU |
| SPARC pulse source | Châtillon | AKOU |
| Rotary modes simulator test bench | Châtillon | AKOU |
| GVT - Ground Vibration Testing | Châtillon | ADSE |
| MOD - Deformation optical measurements | Châtillon | ADSE |
| VL – Laser vibrometer | Châtillon | ADSE |
Software
Numerical simulation
- AGHORA
- CODA
- elsA
- SABRINA_V0
- Solveurs FAST
- SoNICS
- SPACE
Pre/post-processing
- Cassiopee
- FFX
- CAO et CSM
- CATIA, Solidworks, NASTRAN
Optical metrology
- recalage d'image 3D (AFIX2)
- logiciels PIV (FOLKI_SPIV, DAAPPIV) et TomoPIV (PVR pour la reconstruction particulaire et FOLKI3D pour la corrélation)
- mesures de déformation sparse (MDM : OD2M) et dense (DIC: FOLKI_D)